Quality control

Quality Control

Quality Inspection of Incoming Products
– Qualified trained staff is carried out quality control of incoming materials and products quality for manufacture in accordance with ISO 9001 procedures
All stages Quality Control
– Plant For Optics apply precise 100% control of all stages of the production process for an high-end quality required by the customer, using measuring tools and devices of leading companies in metrology

Test and Inspection End products
– Measurement of most common type parameters of lenses and assembled unit such
– Environmental tests
– Plant For Optics provide test reports and full documentation of our services according to customer specifications and international standards

Optical and Laser measuring devices and systems

1. Measuring microscopes

Producer, model

Mitutoyo MF-B2010D 3-axes Measuring Microscope with binocular optical tube 10х. Accessories: oculars WF 15х; 20х and objectives ML 10x, 20x, 50x;

Measuring parameter

Linear dimensions of small objects

Absolute accuracy

XY-axis:(2.2+0.02L)µm, L = Measuring length(mm) when not loaded; Z axis: (5+0,04 L)µm. By photolithography contact method for application of reticle pattern on glass substrates – widths and distances accuracy of 1 micron

Measurement range

XY and Z Stage Travel Range – 200(X) x 100(Y) x 150(Z) mm

Mitutoyo MF-B2010D 3-axes Measuring Microscope

2. Binocular microscopes

Producer, model

Euromex ZE.1624-D Modular stereo Zoom-Head binocular, 7-45x microscope

Measuring parameter

Linear dimensions of small objects

Absolute accuracy

Surface cosmetics:
– up to 5/2×0,016 acc. to ISO 10110;
– S/D= 10-5 acc. to MIL-O-13830A

Measurement range

Field of view 32 -5.1mm
Free working distance 93mm, magnifications 7 – 45x

Euromex ZE.1624-D Modular stereo Zoom-Head binocular, 7-45x microscope

3. Laser interferometers

Producer, model

ZYGO VeriFire XP/DG – high performance laser Fizeau phase-shifting, horizontal mounted interferometer with digital camera and precision interface

Measuring parameter

Control of shape and microtopography of flat, spherical and aspherical surfaces (SAG, RMSa, RMSi, RMSt, regular power and Irregularity)

Absolute accuracy

Repeatability of the three-flat test <2nm, λ/300; Repeatability of RMS < 0,1mm, λ/ 10 000; Fringe resolution: 180 fringes

Measurement range

Zoom range: 1:6x; Alignment/Field of view: 4 inch transmission sphere (TS) output apertures : f/0,65; f/0,75; f/1,5; f/plano
5,2 inch TS by optical connector 4″ to 4+ (5,2″): f/0,7; f/0.8; f/1,6; f/4,2; f/6,4; f/plano
6 inch TS: f/2,2; f/7,2; f/plano

ZYGO VeriFire XP/DG – high performance laser Fizeau phase-shifting

Fizeau interferometer XONOX VT 1200 PS with phase shifting fringe analyzing system

Control of shape and microtopography of flat, spherical and aspherical surfaces (SAG, RMSa, RMSi, RMSt, regular power and Irregularity)

Xonox X-fiz 100 (4″) with optical connector 4″ to 4+ (5,2″), compatible with Zygo style bayonet, giving +30% more aperture for radii measurements; tip-tilt module 6″ for flat measurements.
– min. 1200mm travel (1400mm linear scale range), up to 200mm test diameter (depending on used TS and part holder) TS: f/0,7; f/0.8; f/1,6; f/4,2; f/6,4; f/plano

Fizeau interferometer XONOX VT 1200 PS

Non-contact ZeGage™ Plus3D Optical Profiler with Sub-Nanometer Precision for surfaces microroughness measurements from rough to polished optics

Correlates to 2D and 3D standards, and complies with international standarts surface roughness parameters. High-resolution 1 million pixel image sensor for fast areal measurements in seconds, for excellent surface detail and visualization.
Integrated autofocus and focus aid simplify part setup and minimize operator variability. Fully-automated measurement sequences and field stitching enable high resolution inspection of large areas.

Non-contact ZeGage™

4. Profilometers

Producer, model

Contact profilometer Form Talysurf PGI Optics (Phase Grating Interferometer)

Measuring parameter

Form error by small and large spherical, aspherical and diffractive optics made by optical glass and crystals

Absolute accuracy

high accuracy

Measurement range

measuring range – up to 14mm of sag with a 60mm long stylus and up to 28mm with a 120mm stylus.

Contact profilometer Form Talysurf PGI Optics

5. Spectrophotometers

Producer, model

Perkin Elmer Lambda 950, double beam, double monochromator, ratio recording UV/Vis/NIR

Measuring parameter

Reflection or Transmission properties of a material as a function of wavelength

Absolute accuracy

Wavelength Accuracy
± 0,08 nm UV/Vis;
± 0,30 nm NIR

Measurement range

– Wavelength Range 175nm ÷3300nm
– Size of measured sample – from 5mm up to 150mm;
– Measurement of absolute reflection at the tilt angleof the light beam 8°÷ 70°
– Measurement of Transmission at angles 0-60°, by step 1°

Perkin Elmer Lambda 950

Photon RT

Reflection or Transmission properties of a material as a function of wavelength

Wavelength Accuracy ±0,24 nm

– Wavelength Range: 185nm÷3500nm
– Sample size: 10mm up to 150mm
– Sample measurement of absolute Reflection at the max.tilt angle + 60°

Photon RT

Shimadzu IRAffinity-1

Reflection or Transmission properties of a material as a function of wavelength

Accuracy for wavelength positioning:0.1 cm-1 for 1600 cm-1;
Accuracy of the ordinate in the transmission measurement with a nominal value T = 47% of an uncoated optical component of Ge 10 mm thick: ≤ 0.25%;
Accuracy of the ordinate when measuring the passage of a cut-off filter with a nominal value T = 0%: ≤0.01%;
Ordinary accuracy for low reflection  with a nominal value R <1%: ≤0.02%;
Accuracy of the ordinate when measuring high reflections (mirror coatings) with a nominal value R ≤100%: ≤0.05%

Wavelength range: 1,28 to 28.57 microns

Shimadzu IRAffinity-1

Optomechanical and Optoelectronic measurement devices

6. Spherometers

Producer, model

Trioptics Superspherotronic HR – three-point-contact

Measuring parameter

Radii of curvature of spherical parts and test glasses

Absolute accuracy

Up to ±0.01 %
The maximum measurement accuracy depends on the sample’s radius and the ring used

Measurement range

– Radius (convex) +3 mm to ∞
– Radius (concave) -6 mm to ∞
– Travel of linear encoder±30 mm
– Diameter of part under test 6 mm to 500 mm
– Resolution of the linear encoder 0.1 µm

rioptics Superspherotronic HR – three-point-contact

7. Goniometers

Producer, model

Measuring parameter

– Angle measurements of prisms and wedges
– Surface tilt errors of prism
– Wedge errors, parallelism of optical windows
– Angles of microprisms
– Pyramidal errors

Absolute accuracy

– Right Angle prisms with angles ± 3 arc min
– Roof prisms with roof angle 90° ± 3 arc sec

Measurement range

360°

product

Special measurement systems

Producer, model

Lenscan LS 40 and Lenscan LS 200 Low coherence interferometer with 1 tip/tilt compatable with FOGALE nanotech lenscan’s collimators

Measuring parameter

Laser non-contact measurement of the position and the center thickness of all optical elements (lenses, cubes, flats …) of an assembly along the optical axis

Absolute accuracy

±1µm

Measurement range

– Measurement range 200mm; – Working distance 250mm; – Min.measurable thickness < 30 µm (option: < 10µm) in air

Lenscan LS 200 1CH

OPTOTECH DZP COMPACT – Transmitted light centering test system

Centering Error According to ISO 10110

centration error up to 30 arc sec

OPTOTECH DZP COMPACT

Trioptics OptiCentric measurement system on transmission and reflection principle

Centering Error According to ISO 10110

centration error up to 30 arc sec

Trioptics OptiCentric

OTS 200 test station for single lenses and optical systems, with motorized, software controlled positioning, measuring collimator f’=200mm and vertical mounted electronic autocollimator f’=200/40

– Positive/negative focal length (EFL);
– Back focal length (BFL);
– Flange focal length (FFL);
– positive/negative radius

EFL, R, BFL, FFL: up to ±0,3%; MTF (on axis, only for positive BFL) – 3 %

– EFL, R, BFL, FFL: ±0,5mm… ±600mm,
– MTF (on axis, only for positive BFL) – 0 … 200 lp/mm – Specimen diameter up to 100 mm

OTS 200 test station for single lenses and optical systems

Xonox CT 200 -highly precise and robust Center Thickness measurement system

Center thickness of ground, polished and coated optics in both

below Ø8mm up to Ø200mm

Xonox CT 200 -highly precise and robust Center Thickness measurement system

MTF on/off axis Inframet ORI test station for VIS, VIS/NIR, SWIR, MWIR, LWIR Objectives

MTF, EFL, BFL, distortion,

data
MTF on/off axis Inframet ORI test station for VIS, VIS/NIR, SWIR, MWIR, LWIR Objectives

Testing and inspection of end products

Producer, model

Measurement of common type parameters of lenses and assembled units, Environmental test equipment acc. To standards ISO-10110 MIL-O-13830 MIL-C-48497 and more

Measuring parameter

Distortion, Vignetting, Relative transmittance, Temperature cycles, Relative humidity, Vibrations and shock tests

Absolute accuracy

Measurement range

Temperature cycles in range -40° to +80°; Relative humidity range 10% to 90%

Measurement of common type parameters of lenses and assembled units
Measurement of common type parameters of lenses and assembled units